Applications of Atomic Force Microscopy in Optical Fiber Research

  • Q. Zhong
  • D. Inniss

Abstract

In this paper, novel applications of atomic force microscopy (AFM) to optical fiber research are reviewed. Three specific examples are presented, illustrating the effective use of AFM to advance our understanding of material structure and properties in optical fibers. Existing issues and the need for innovation in applications of AFM to new material systems are also discussed.

Keywords

Atomic Force Microscopy Atomic Force Microscopy Technique Urethane Acrylate Atomic Force Microscopy Micrographs Contact Mode Atomic Force Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • Q. Zhong
    • 1
  • D. Inniss
    • 2
  1. 1.AT&THolmdelUSA
  2. 2.Lucent TechnologiesMurray HillUSA

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