Multi-Wavelength Combination Source — A Novel Technique for White Light Interferometry
White light interferometry (WLI) has been proved as a successful technique to improve the unambiguous range of a conventional interferometric system and to make absolute measurements. In WLI operation, the central fringe position in the output fringe pattern has crucial importance as a knowledge of such a position provides a reliable basic reference.
KeywordsLaser Diode Fringe Pattern Optical Path Difference Optic Letter IEEE Photonic Technology Letter
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