Introduction

  • Said Hamdioui
Part of the Frontiers in Electronic Testing book series (FRET, volume 26)

Abstract

Fast and efficient testing is an important step in any manufacturing process. With the recent advances in semiconductor technology, the design and use of memories for realizing complex systems-on-a-chip has been widespread. The cost of testing such memories increases rapidly with every generation. Precise and realistic fault modeling, and efficient test design, in order to keep test cost and time within economically acceptable limits, are therefore essential.

Keywords

Memory Device Fault Model Fault Coverage Static Random Access Memory SRAM Cell 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Said Hamdioui
    • 1
  1. 1.Delft University of TechnologyThe Netherlands

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