Transistor Mismatch: Evolution and Relevance
Measuring the electrical characteristics of a set of transistors with the same gate-length and gate-width that are processed in the same technology, will not yield the same results. During the fabrication process small variations will occur that result in a statistical variation of the transistor properties. This variation depends on the dimensions of the matched component and its biasing conditions. This phenomenon is referred to as transistor mismatch.
KeywordsThreshold Voltage Test Structure Saturation Region Test Chip Mismatch Parameter
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