Defect Oriented Analog Testing

  • Manoj Sachdev
Part of the Frontiers in Electronic Testing book series (FRET, volume 10)

Abstract

Analog circuits due to their non-binary operation are influenced by process defects in a different manner compared to digital circuits. Seemingly an innocuous defect for digital logic may cause unacceptable degradation in analog circuit performance. This chapter surveys the advances in the field of defect oriented analog testing and summarizes strengths and weaknesses of the method for analog circuits.

Keywords

Analog Circuit Test Vector Digital Circuit Fault Coverage Fault Simulation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 1999

Authors and Affiliations

  • Manoj Sachdev
    • 1
  1. 1.Philips ResearchThe Netherlands

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