Diffuse Scattering From Volume Defects in Thin Layers

  • Ullrich Pietsch
  • Václav Holý
  • Tilo Baumbach
Part of the Advanced Texts in Physics book series (ADTP)

Abstract

In this chapter we present a detailed theoretical description of diffuse x-ray scattering from structure defects randomly placed in the volume of thin layers. We deal with so called weak defects (point defects and their clusters, small precipitates of another phase in the crystal lattice) as well as with strong defects (dislocations and their pile-ups). The description is based on the theory explained in the monograph [207]. In contrast to this work, we focus our description on defects in thin layers, where the relaxation at the interfaces affects the symmetry of the deformation field and consequently influences the reciprocal space distribution of scattered intensity.

Keywords

Displacement Field Burger Vector Scattered Intensity Misfit Dislocation Diffuse Scattering 
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Copyright information

© Springer Science+Business Media New York 2004

Authors and Affiliations

  • Ullrich Pietsch
    • 1
  • Václav Holý
    • 2
  • Tilo Baumbach
    • 3
  1. 1.Institute of PhysicsUniversity of PotsdamPotsdamGermany
  2. 2.Department of Solid State PhysicsMasaryk UniversityBrnoCzech Republic
  3. 3.Institut fuer SynchrotronstrahlungForschungszentrum Karlsruhe in der Helmholtz-GemeinschaftKarlsruheGermany

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