Fractal-based Study of Magnetic Thin Films
AFM and MFM (Mamin et al., 1989) have been extensively used for both qualitative and quantitative analysis of surface morphologies and magnetic microstructures of magnetic media. Quantitative analysis provides important information in the study of high density recording media.
KeywordsFractal Dimension Roughness Parameter Fractal Parameter Isothermal Remanent Magnetization Increase Annealing Time
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