Fractal-based Study of Magnetic Thin Films

  • J. M. Li
  • Li Lü
  • M. O. Lai
  • B. Ralph
Chapter

Abstract

AFM and MFM (Mamin et al., 1989) have been extensively used for both qualitative and quantitative analysis of surface morphologies and magnetic microstructures of magnetic media. Quantitative analysis provides important information in the study of high density recording media.

Keywords

Fractal Dimension Roughness Parameter Fractal Parameter Isothermal Remanent Magnetization Increase Annealing Time 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2003

Authors and Affiliations

  • J. M. Li
    • 1
  • Li Lü
    • 2
  • M. O. Lai
    • 2
  • B. Ralph
    • 3
  1. 1.Data Storage InstituteSingapore
  2. 2.Department of Mechanical EngineeringNational University of SingaporeSingapore
  3. 3.Faculty of Technology and Information SystemsBrunel UniversityUK

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