Thermal Testing of Integrated Circuits pp 53-96 | Cite as
Thermal analysis in integrated circuits
Chapter
Abstract
The goal of this chapter is to present different techniques to obtain temperature maps or temperature waveforms at certain areas or points of an integrated circuit (IC). The data we need to perform this analysis are: description of the physical structure of the IC, thermal properties of the materials from which it is made, placement of the devices that act as heat sources, description of its power consumption waveform and, finally, the thermal conditions of the IC’s surroundings, which will determine what we will call the boundary conditions.
Keywords
IEEE Transaction Heat Source Heat Flow Integrate Circuit Heat Transfer Equation
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References
- [94]R.P. Gray and D.J. Hamilton, “Analysis of Electrothermal Integrated Circuits,” IEEE Journal of Solid State Circuits, Vol. SC-6, no. 1, pp. 8–14, Feb. 1971.CrossRefGoogle Scholar
- [95]V. Székely, “Thermal Monitoring of Microelectronic Structures,” Microelectronics Journal, Vol. 25, pp. 157–170, 1994.CrossRefGoogle Scholar
- [96]R.P. Gray, D.J. Hamilton and J.D. Lieux, “Analysis and Design of Temperature Stabilized Substrate Integrated Circuits”, IEEE Journal of Solid State Circuits, Vol. SC-9, no. 2, pp. 61–69Google Scholar
- [97]P. Antognetti, G.R. Bisio, F. Curatelli and S. Palara, “Three Dimensional Transient Thermal Simulation: Application to Delayed Short Circuit Protection in Power IC’s,” IEEE Journal of Solid State Circuits, Vol. SC-15, no. 3, pp. 227–281, 1980.Google Scholar
- [98]F.N. Massana, “A Closed Form Solution of Junction to Substrate Thermal Resistance in Semiconductor Chips,” IEEE Transactions on Components, Packaging and Manufacturing Technology–Part A, Vol. 19, no. 4, Dec. 1996, pp. 539–545.CrossRefGoogle Scholar
- [99]W. Van Petegem, B. Geetaerts, W. Sansen and B. Graindourze, “Electrothermal Simulation and Design of Integrated Circuits, ”IEEE Journal of Solid State Circuits. Vol. no. 29, no. 2, Feb. 1994, pp. 143–146.Google Scholar
- [100]K. Poulton, K.L. Knudsen, J.J. Corcoran, K.C. Wang, R.L. Pierson and R.B. Nubling, “Thermal design and simulation of bipolar integrated circuits, ”IEEE Journal of Solid State Circuits, Vol. 27, no. 10, Oct. 1992, pp. 1379–1386.CrossRefGoogle Scholar
- [101]C.C. Lee, A.L. Palisoc and Y.J. Min, “Thermal analysis of integrated circuit devices and packages,” IEEE Transactions on Computers, Hybrids, and Manufacturing Technology, Vol. 12, no. 4, Dec. 1989, pp. 701–709.Google Scholar
- [102]C.C. Lee, A.L. Palisoc and Y.J. Min, “A general integration algorithm for the inverse Fourier transform of four-layer infinite plate structures”, IEEE Transactions on Computers, Hybrids, and Manufacturing Technology,Vol. 12, no. 4, Dec. 1989, pp.710716.Google Scholar
- [103]H.S. Carslaw and J.C. Jaeger, “Conduction of Heat in Solids,” Oxford Science Publications, 1959.Google Scholar
- D. Maillet, S. André, J.C. Batsale, A. Degiovani and C. Moyne, “Thermal Quadrupoles. Solving the Heat Equation through Integral Transforms,” Wiley, 2000.Google Scholar
- [105]R.V. Churchill, “Fourier Series and Boundary Value Problems,” McGraw-Hill, Second Edition 1963.Google Scholar
- [106]G.P. Tolstov, “Fourier Series,” Dover Publications, Inc., 1976.Google Scholar
- [107]A.F. Mills, “Heat and Mass Transfer”, Irwing Inc., 1995.Google Scholar
- [108]L.C. Thomas, “Heat Transfer”, Prentice Hall, 1992.Google Scholar
- [109]R.D. Lindsted and R.J. Surty, “Steady-State Junction Temperatures of Semiconductor Chips,” IEEE Transactions on Electron Devices, Vol. ED-19, no. 1, Jan. 1972, pp. 41–44CrossRefGoogle Scholar
- [110]T.S. Fisher, C.T. Averdisian and J.P. Krusius, “Transient Thermal Response Due to Periodic Heating on a Convectively Cooled Substrate,” IEEE Transactions on Components, Packaging and Manufacturing Technology–Part B. Vol. 19, no. 1, Feb. 1996, pp. 225–262.CrossRefGoogle Scholar
- [111]R. Castello and P. Antognetti, “Integrated-Circuit Thermal Modeling,” IEEE Journal of Solid-State Circuits, Vol. SC-13, no. 3, June 1978, pp. 363–366.CrossRefGoogle Scholar
- [112]V. Kadambi and N. Abuaf, “An Analysis of the Thermal Response of Power Chip Packages,” IEEE Transactions on Electron Devices, Vol. ED-32, no. 6, June 1985.Google Scholar
- [113]D. Chen, E. Li, E. Rosanbaum and S.S. Kang, “Interconnect Thermal Modeling for Accurate Simulation of Circuit Timing and Reliability,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 19, no. 2, Feb. 2000, pp. 197–205.CrossRefGoogle Scholar
- [114]A. Ammous, S. Ghedira, B. Allard and D. Renault, “Choosing a Thermal Model for Electrothermal Simulation of Power Semiconductor Devices,” IEEE Transactions on Power Electronics, Vol. 14, no. 2, March 1999, pp. 300–307.CrossRefGoogle Scholar
- [115]I. Guven, C.L. Chan and E. Madenci, “Transient Two-Dimensional Thermal Analysis of Electronic Packages by the Boundary Element Method,” IEEE Transactions on Advanced Packaging, Vol. 22, no. 3, August 1999, pp. 476–486.CrossRefGoogle Scholar
- [116]J.T. Hsu and L. Vu-Quoc, “A Rational Formulation of thermal Circuit Models for Electrothermal Simulation–Part 1: Finite Element Method,” IEEE Transactions on Circuits and Systems–I. Vol. 43, no. 9, Sep. 1996, pp. 721–732.CrossRefGoogle Scholar
- [117]J.T. Hsu and L. Vu-Quoc, “A Rational Formulation of thermal Circuit Models for Electrothermal Simulation–Part II: Model Reduction Techniques,” IEEE Transactions on Circuits and Systems–I. Vol. 43, no. 9, Sep. 1996, pp. 733–744.CrossRefGoogle Scholar
- [118]L.T. Pillage and R.A. Rohrer, “Asymptotic Waveform Evaluation for Timing Analysis,” IEEE Transactions on Computer-Aided Design, Vol. 9, no. 4, pp. 352–366.Google Scholar
- [119]D. Liu, V. Phaniulatha, Q. Zhang and M.S. Nakhla, “Asymptotic Thermal Analysis of Electronic Packages and Printed-Circuit Boards, ”IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part A, Vol. 18, no. 4, Dec. 1995.Google Scholar
- [120]S. Wünsche, C. Claub, P. Schwarz and F. Winkler, “Electro-Thermal Circuit Simulation Using Simulator Coupling,” IEEE Transactions on VLSI Systems, Vol. 5, Sep. 1997, pp. 277–282.CrossRefGoogle Scholar
- [121]G. Digele, S. Lindenkreuz and E. Kasper, “Fully Coupled Dynamic Electro-Thermal Simulation, ”IEEE Transactions on VLSI Systems, Vol. 5, no. 3, Sep. 1997, pp. 250–257.CrossRefGoogle Scholar
- [122]M.N. Sabry, A. Bontemps, V. Aubert and R. Vahrmann, “Realistic and Efficient Simulation of Electro-Thermal Effects in VLSI Circuits, ”IEEE Transactions on VLSI Systems, Vol. 5, no. 3, Sep. 1997, pp. 283–289.CrossRefGoogle Scholar
- [123]A.R. Hefner and D.L. Blackburn, “Simulating the Dynamic Electrothermal Behavior of Power Electronic Circuits and Systems,” IEEE Transactions on Power Electronics, Vol. 8, no. 4, Oct. 1993, pp. 376–385.CrossRefGoogle Scholar
- [124]S.S. Lee and D.J. Allstot, “Electrothermal Simulation of Integrated Circuits,” IEEE Journal of Solid State Circuits, Vol. 28, no. 12, Dec. 1993, pp. 1283–1293.CrossRefGoogle Scholar
- [125]V. Székely, A. Poppe, A. Pâhi, A. Csendes, G. Hajas and M. Rencz, “Electro-Thermal and Logi-Thermal Simulation of VLSI Designs,” IEEE Transactions on VLSI Systems, Vol. 5, no. 3, Sep. 1997. pp. 258–269.CrossRefGoogle Scholar
- [126]J. Altet, A. Rubio, E. Shaub, S. Dilhaire and W. Claeys, “Thermal Coupling in Integrated Circuits: Application to Thermal Testing,” IEEE Journal of Solid State Circuits, Vol. 36, no. 1, Jan. 2001, pp. 81–91.CrossRefGoogle Scholar
- [127]K Fukahori and P.R. Gray, “Computer Simulation of Integrated Circuits in the Presence of Electrothermal Interaction,” IEEE Journal of Solid-State Circuits, Vol. sc-11, no. 6, Dec. 1976, pp. 834–848Google Scholar
- [128]V. Székely, M. Renz and B. Courtois, “Tracing the Thermal Behavior of IC’s,” IEEE Design and Test of Computers. April-June 1998, pp. 14–21.Google Scholar
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