Introduction to the testing of integrated circuits

  • Josep Altet
  • Antonio Rubio
Chapter

Abstract

Today’s electronic technology is based on the design and manufacture of integrated circuits. The concept of the integrated circuit comes from the work of 2000 Nobel Prize winner J.S. Kilby [1]. Its origins can be dated to February 1959. In his patent declaration, Kilby defines the integrated circuit with the following statement: “this invention relates to miniature electronic circuits, and more particularly to unique integrated electronic circuits fabricated from semiconductor material”.

Keywords

Metal Oxide Semiconductor Test Vector Realistic Defect Delay Fault Automatic Test Equipment 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 2002

Authors and Affiliations

  • Josep Altet
    • 1
  • Antonio Rubio
    • 1
  1. 1.University Politècnia de CatalunyaSpain

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