EBSD Contra TEM Characterization of a Deformed Aluminum Single Crystal

  • Xiaoxu Huang
  • Dorte Juul Jensen

Abstract

In recent years the development has been toward more and more microstructural characterization being done by automatic EBSD* measurements at the expense of TEM studies. This trend has been expressed very directly by Professor F.J. Humphreys: “Although I used to be a TEM-man, I now do everything I can to avoid doing TEM work” (Humphreys, 1999a). Reasons for this trend are the advances of the EBSD technique toward faster and easier measurements, more sophisticated data representations and (very importantly) better spatial resolution of the technique. In modern FEG-SEMs the spatial resolution is estimated to be three times better than in conventional W-filament SEMs (Humphreys, 1999b) and subgrain structures of dimensions down to 0.2 µm in aluminum are analyzed (Humphreys, 1999b). This means that characterization previously done by TEM is now being done by EBSD (Humphreys, 1999b; Terhune et al., 1999).

Keywords

Dislocation Structure Misorientation Angle Dislocation Boundary Misorientation Distribution Deformation Microstructure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 2000

Authors and Affiliations

  • Xiaoxu Huang
    • 1
  • Dorte Juul Jensen
    • 1
  1. 1.Materials Research DepartmentRisø National LaboratoryRoskildeDenmark

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