Elastically scattered electrons are the major source of contrast in TEM images and they also create the intensity distributions in diffraction patterns, so we need to understand what controls this process. We’ll consider elastic scattering first from single isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave aspects of the character of the electron.
KeywordsElastic Scattering Differential Cross Section Electron Cloud Diffract Beam Path Difference
Unable to display preview. Download preview PDF.
- Andrews, K.W., Dyson, D.J., and Keown, S.R. (1967) Electron Diffraction Patterns, The Institute of Physics, Bristol, United Kingdom.Google Scholar
- Henoc, J. and Maurice, F., Eds. (1976) Use of Monte Carlo Calculations, NBS Special Publication 460, Washington, DC.Google Scholar
- Kyser, D., Ed. (1984) Electron-Beam Specimen Interactions for Microscopy, Microanalysis and Lithography, SEM Inc., AMF O’Hare, Illinois.Google Scholar
- Hall, C.E. (1953) Introduction to Electron Microscopy, p. 229, McGraw-Hill, New York.Google Scholar
- Joy, D.C., Romig, A.D. Jr., and Goldstein, J.L, Eds. (1986) Principles of Analytical Electron Microscopy, p. 6, Plenum Press, New York.Google Scholar
- Reimer, L. (1993) Transmission Electron Microscopy, 3rd edition, Springer-Verlag, New York.Google Scholar
- Rutherford, E. (1911) Phil. Mag. 21, 669.Google Scholar
- Taylor, C. (1987) Diffraction, Adam Hilger, Bristol, United Kingdom.Google Scholar