Conclusions and Current Research
This chapter describes our conclusions and directions of current research. We first discuss what we have learned in the course of this research. We then discuss how this research has contributed to the field of yield modeling and simulation. We then discuss how this work is being extended to improve simulator performance, use new analysis techniques, and how local and global defects can both be combined in one simulator.
KeywordsLocal Defect Critical Area Fault Group Fault Analysis Chip Sample
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