Lifetime Data Analysis

  • F. H. Reynolds
Part of the NATO Advanced Study Institutes Series book series (NSSB, volume 46)

Abstract

The outcome of electronic-component reliability studies is usually a sample of lifetimes and the task is then one of drawing inferences about the conceptual population from which the sample has been withdrawn. Quite often “lifetime” will refer to the interval between the real time at which a component enters service and the later time at which it fails to satisfy its performance specification for any reason. The term may also be applied however to a lifespan determined by specified causes only. In the laboratory, lifetimes may arise from simulated service operation or operation under conditions deliberately different from service, usually more onerous. Still further, lifetimes may be measured on only an elementary part of a component.

Keywords

Lognormal Distribution Hazard Rate Weibull Distribution Operational Amplifier Lifetime Distribution 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1979

Authors and Affiliations

  • F. H. Reynolds
    • 1
  1. 1.Post Office Research CentreMartlesham HeathIpswhichEngland

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