Electrical Properties of Silicon p-n Junctions Subjected to Nonuniform Deformation
A study was made of the influence of nonuniform deformation, caused by the pressure of a sharp corundum needle, on the current flowing through shallow p-n junctions in silicon. Two ranges of forces applied to the needle are distinguished: weak forces, whose effects are reversible, and strong forces, whose effects are irreversible. The concept of a critical force Fcr, dividing these two ranges, is introduced. Comparison of the experimental data with the theory is carried out in the weak-force range.
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