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Electrical Properties of Silicon p-n Junctions Subjected to Nonuniform Deformation

  • A. L. Polyakova
  • V. V. Shklovskaya-Kordi

Abstract

A study was made of the influence of nonuniform deformation, caused by the pressure of a sharp corundum needle, on the current flowing through shallow p-n junctions in silicon. Two ranges of forces applied to the needle are distinguished: weak forces, whose effects are reversible, and strong forces, whose effects are irreversible. The concept of a critical force Fcr, dividing these two ranges, is introduced. Comparison of the experimental data with the theory is carried out in the weak-force range.

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Copyright information

© Springer Science+Business Media New York 1971

Authors and Affiliations

  • A. L. Polyakova
    • 1
  • V. V. Shklovskaya-Kordi
    • 1
  1. 1.Acoustics InstituteMoscowRussia

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