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The Main Damage Characteristics of Semiconductor Devices Under High-Power Microwave

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Book cover Communications, Signal Processing, and Systems (CSPS 2018)

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 517))

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Abstract

This paper takes the PIN diode as the main object of analysis, theoretically analyzes it’s operating principle and the type of damage occurring under the impact of the high-power microwave, and proposes that the damage characteristics of the device should be based on the time and energy.

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References

  1. Schamiloglu, E.: High power microwave sources: where do we go from here? In: Conference Record of the Twenty-Fifth International IEEE Power Modulator Symposium, 2002 and 2002 High-Voltage Workshop. 30 June–3 July (pp. 190–191) (2002)

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  2. Doherty, W.E., Joos, R.D.: The PIN diode circuit designer’ handbook. Microsemi Corp

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Author information

Authors and Affiliations

  1. Shijiazhuang Campus of Army Engineering University, Shijiazhuang, China

    Kaibai Chen

Authors
  1. Kaibai Chen
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Corresponding author

Correspondence to Kaibai Chen .

Editor information

Editors and Affiliations

  1. Department of Electrical Engineering, University of Texas at Arlington, Arlington, TX, USA

    Qilian Liang

  2. School of Information and Communication Engineering, Dalian University of Technology, Dalian, China

    Xin Liu

  3. School of Information Science and Technology, Dalian Maritime University, Dalian, China

    Zhenyu Na

  4. College of Electronic and Communication Engineering, Tianjin Normal University, Tianjin, China

    Wei Wang

  5. College of Electronic and Communication Engineering, Tianjin Normal University, Tianjin, China

    Jiasong Mu

  6. College of Electronic and Communication Engineering, Tianjin Normal University, Tianjin, China

    Baoju Zhang

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© 2020 Springer Nature Singapore Pte Ltd.

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Cite this paper

Chen, K. (2020). The Main Damage Characteristics of Semiconductor Devices Under High-Power Microwave. In: Liang, Q., Liu, X., Na, Z., Wang, W., Mu, J., Zhang, B. (eds) Communications, Signal Processing, and Systems. CSPS 2018. Lecture Notes in Electrical Engineering, vol 517. Springer, Singapore. https://doi.org/10.1007/978-981-13-6508-9_67

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  • DOI: https://doi.org/10.1007/978-981-13-6508-9_67

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-6507-2

  • Online ISBN: 978-981-13-6508-9

  • eBook Packages: EngineeringEngineering (R0)

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