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International Symposium on Signal Processing and Intelligent Recognition Systems

SIRS 2018: Advances in Signal Processing and Intelligent Recognition Systems pp 282–297Cite as

Bit-Plane Specific Measures and Its Applications in Analysis of Image Ciphers

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Part of the book series: Communications in Computer and Information Science ((CCIS,volume 968))

Abstract

The paper presents bit-plane specific new measures to visualize the extensive statistical detail of an image. We compute the frequency of ones, maximum run length and correlation among rows (columns) in each bit-plane of an image. The computed measures give row-wise and column-wise structural detail at bit-plane level and help an interpreter to analyze given image deeply for its effective interpretation and understanding. In this paper, the application of these measures is shown in cryptography to statistically analyze the image ciphers. The simulation study shows that the proposed measures are very useful and can be applied in various image processing applications for pattern recognition and understanding of visual objects.

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Author information

Authors and Affiliations

  1. Scientific Analysis Group, Defence Research and Development Organization, Delhi, India

    Ram Ratan

  2. Department of Mathematics, Hansraj College, University of Delhi, Delhi, India

    Arvind

Authors
  1. Ram Ratan
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  2. Arvind
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Corresponding author

Correspondence to Ram Ratan .

Editor information

Editors and Affiliations

  1. Indian Institute of Information Technology and Management, Kerala, India

    Sabu M. Thampi

  2. Department of Computer and Electrical Engineering and Computer Science, Florida Atlantic University, Boca Raton, FL, USA

    Oge Marques

  3. Department of Electrical and Computer Engineering, Ryerson University, Toronto, ON, Canada

    Sri Krishnan

  4. Department of Computer Science and Information Engineering, Providence University, Taichung, Taiwan

    Kuan-Ching Li

  5. University of Naples Federico II, Naples, Italy

    Domenico Ciuonzo

  6. Electrical Engineering Department, Indian Institute of Technology Patna, Patna, India

    Maheshkumar H. Kolekar

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© 2019 Springer Nature Singapore Pte Ltd.

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Ratan, R., Arvind (2019). Bit-Plane Specific Measures and Its Applications in Analysis of Image Ciphers. In: Thampi, S., Marques, O., Krishnan, S., Li, KC., Ciuonzo, D., Kolekar, M. (eds) Advances in Signal Processing and Intelligent Recognition Systems. SIRS 2018. Communications in Computer and Information Science, vol 968. Springer, Singapore. https://doi.org/10.1007/978-981-13-5758-9_24

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  • DOI: https://doi.org/10.1007/978-981-13-5758-9_24

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-13-5757-2

  • Online ISBN: 978-981-13-5758-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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