Abstract
It has become a great problem nowadays that the information contained in an IC chip is not provided with adequate security against the cunning attackers. The modern chip designs inbuilt with a design for testing (DfT) that enable testing process to become more easier, but it also acts as backdoor tool to the hackers to retrieve the sensitive data from the chip. So, in order for providing security for the information contained in the chip, we introduce a reconfigurable PUF design technique with the DfT. This security is achieved by providing a barrier against the hamming distance-based attack. In this paper, we compare the analysis of modified linear feedback shift registers (LFSRs), pseudorandom sequence generator, and physical unclonable function (PUF) in terms of randomness, hamming distance, and security. The result of comparison provides the PUF design have maximum security without effecting the testability of the circuits.
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Shiny, M.I., Reshma, R., Ross, S., John, S., Sreevidya, R., Moothedeth, S. (2019). Security Systems in Design for Testing. In: Wang, J., Reddy, G., Prasad, V., Reddy, V. (eds) Soft Computing and Signal Processing . Advances in Intelligent Systems and Computing, vol 898. Springer, Singapore. https://doi.org/10.1007/978-981-13-3393-4_51
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DOI: https://doi.org/10.1007/978-981-13-3393-4_51
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