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Study of Radiation-Induced Soft-Errors in FPGAs for Applications at High-Luminosity \(e^+e^-\) Colliders

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Abstract

At the KEK laboratory (Tsukuba, Japan), the SuperKEKB \(e^{+}e^{-}\) collider has been commissioned in February 2016 and it has been operated until June 2016 completing the so-called Phase-1.

In this work, we present measurements of configuration soft-errors induced by radiation in a SRAM-based FPGA device installed within 1 m from one of the SuperKEKB beam pipes. During the SuperKEKB operation, we continuously read back the FPGA configuration memory in order to spot upsets and we logged power consumption at the different power rails of the device in order to search for total dose effects. Since the operation current of the SuperKEKB collider spanned a range between 50 and 500 mA for both the electron and positron rings, the experimental scenario allowed us to perform measurements in different radiation conditions.

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Acknowledgments

This work is part of the ROAL SIR project funded by the Italian Ministry of Research (MIUR), grant no. RBSI14JOUV. “Accesso Aperto MIUR". The institutions which contributed to the results reported in this work are listed below as affiliations of the authors. We also wish to thank all the members of the BEAST2 community for supporting this activity.

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Correspondence to Raffaele Giordano .

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Giordano, R., Tortone, G., Aloisio, A. (2018). Study of Radiation-Induced Soft-Errors in FPGAs for Applications at High-Luminosity \(e^+e^-\) Colliders. In: Liu, ZA. (eds) Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017. TIPP 2017. Springer Proceedings in Physics, vol 212. Springer, Singapore. https://doi.org/10.1007/978-981-13-1313-4_74

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