Abstract
The lifetime information for highly reliable products is usually assessed by a degradation model. When there are measurement errors in monotonic degradation paths, non-monotonic model assumption can lead to contradictions between physical/chemical mechanisms and statistical explanations. To settle the contradiction, this study presents an independent increment degradation-based process that simultaneously considers the unit-to-unit variability, the within-unit variability, and the measurement error in the degradation data. Several case studies show the flexibility and applicability of the proposed models. This paper also uses a separation-of-variables transformation with a quasi-Monte Carlo method to estimate the model parameters. A degradation diagnostic is provided to evaluate the validity of model assumptions.
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References
Bagdonavičius, V., & Nikulin, M. S. (2000). Estimation in degradation models with explanatory variables. Lifetime Data Analysis, 7, 85–103.
Barndorff-Nielsen, O. E., Mikosch, T., & Resnick, S. I. (2001). Lévy Processes: Theory and Applications. Boston: Birkhäuse.
Cheng, Y. S., & Peng, C. Y. (2012). Integrated degradation models in R using iDEMO. Journal of Statistical Software, 49, 1–22.
Chuang, S. L., Ishibashi, A., Kijima, S., Nakayama, N., Ukita, M., & Taniguchi, S. (1997). Kinetic model for degradation of light-emitting diodes. IEEE Journal of Quantum Electronics, 33, 970–979.
Di Nardo, E., Nobile, A. G., Pirozzi, E., & Ricciardi, L. M. (2001). A computational approach to first-passage-time problems for Gauss-Markov processes. Advances in Applied Probability, 33, 453–482.
Doksum, K. A., & Hóyland, A. (1992). Model for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution. Technometrics, 34, 74–82.
Doksum, K. A., & Normand, S. L. T. (1995). Gaussian models for degradation processes-part I: methods for the analysis of biomarker data. Lifetime Data Analysis, 1, 131–144.
Efron, B., & Tibshirani, R. J. (1993). An Introduction to the Bootstrap. New York: Chapman & Hall/CRC.
Fukuda, M. (1991). Reliability and Degradation of Semiconductor Lasers and LEDs. Boston: Artech House.
Genz, A. (1992). Numerical computation of multivariate normal probabilities. Journal of Computational and Graphical Statistics, 1, 141–150.
Genz, A., & Bretz, F. (2009). Computation of Multivariate Normal and\(t\)Probabilities. Berlin: Springer.
Hamada, M. S., Wilson, A. G., Reese, C. S., & Martz, H. F. (2008). Bayesian Reliability. New York: Springer.
Hickernell, F. J. (1998). A generalized discrepancy and quadrature error bound. Mathematics of Computation, 67, 299–322.
Hickernell, F. J. (2002). Obtaining \(O(N^{-2+\epsilon })\) convergence for lattice quadrature Rrules. In K. T. Fang, F. J. Hickernell, & H. Niederreiter (Eds.), Monte Carlo and Quasi-Monte Carlo Methods 2000 (pp. 274–289). Berlin: Springer.
Kallen, M. J., & van Noortwijk, J. M. (2005). Optimal maintenance decisions under imperfect inspection. Reliability Engineering and System Safety, 90, 177–185.
Lawless, J., & Crowder, M. (2004). Covariates and random effects in a gamma process model with application to degradation and failure. Lifetime Data Analysis, 10, 213–227.
Lu, C. J., & Meeker, W. Q. (1993). Using degradation measures to estimate a time-to-failure distribution. Technometrics, 35, 161–174.
Lu, D., Pandey, M. D., & Xie, W. C. (2013). An efficient method for the estimation of parameters of stochastic gamma process from noisy degradation measurements. Journal of Risk and Reliability, 227, 425–433.
Meeker, W. Q., & Escobar, L. A. (1998). Statistical Methods for Reliability Data. New York: Wiley.
Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis. New York: Wiley.
Padgett, W. J., & Tomlinson, M. A. (2004). Inference from accelerated degradation and failure data based on Gaussian process models. Lifetime Data Analysis, 10, 191–206.
Park, C., & Padgett, W. J. (2005). Accelerated degradation models for failure based on geometric Brownian motion and gamma process. Lifetime Data Analysis, 11, 511–527.
Peng, C. Y., & Tseng, S. T. (2013). Statistical lifetime inference with skew-Wiener linear degradation models. IEEE Transactions on Reliability, 62, 338–350.
Peng, C. Y. (2015a). Inverse Gaussian processes with random effects and explanatory variables for degradation data. Technometrics, 57, 100–111.
Peng, C. Y. (2015b). Optimal classification policy and comparisons for highly reliable products. Sankhyā B, 77, 321–358.
Peng, C. Y. & Cheng, Y. S. (2016), Threshold degradation in R using iDEMO. In M. Dehmer, Y. Shi, & F. Emmert-Streib (Eds.) Computational Network Analysis with R: Applications in Biology, Medicine and Chemistry (pp. 83–124). Germany: Wiley-VCH Verlag GmbH & Co. https://doi.org/10.1002/9783527694365.ch4.
Peng, C. Y., & Tseng, S. T. (2009). Misspecification analysis of linear degradation models. IEEE Transactions on Reliability, 58, 444–455.
Richtmyer, R. D. (1951). The evaluation of definite integrals, and a quasi-Monte-Carlo method based on the properties of algebraic numbers. Technical Report LA-1342, Los Alamos Scientific Laboratory.
Shiomi, H., & Yanagisawa, T. (1979). On distribution parameter during accelerated life test for a carbon film resistor. Bulletin of the Electrotechnical Laboratory, 43, 330–345.
Si, X. S., Wang, W. B., Hu, C. H., Zhou, D. H., & Pecht, M. G. (2012). Remaining useful life estimation based on a nonlinear diffusion degradation process. IEEE Transactions on Reliability, 61, 50–67.
Singpurwalla, N. D. (1995). Survival in dynamic environments. Statistical Science, 10, 86–103.
Singpurwalla, N. D. (1997), Gamma processes and their generalizations: an overview. In R. Cook, M. Mendel, & H. Vrijling, (Eds.), Engineering Probabilistic Design and Maintenance for Flood Protection (pp. 67–73). Dordrecht: Kluwer Academic.
Sloan, I. H., & Joe, S. (1994). Lattice Methods for Multiple Integration. Oxford: Oxford University Press.
Suzuki, K., Maki, K., & Yokogawa, S. (1993). An analysis of degradation data of a carbon film and the properties of the estimators. In K. Matusita, M. L. Puri, & T. Hayakawa, (Eds.), Proceedings of the Third Pacific Area Statistical Conference (pp. 501–511). Zeist: The Netherlands.
Tsai, C. C., Tseng, S. T., & Balakrishnan, N. (2012). Optimal design for gamma degradation processes with random effects. IEEE Transactions on Reliability, 61, 604–613.
van Noortwijk, J. M. (2009). A survey of the application of gamma processes in maintenance. Reliability Engineering and System Safety, 94, 2–21.
Wang, X., & Xu, D. (2010). An inverse Gaussian process model for degradation data. Technometrics, 52, 188–197.
Whitmore, G. A. (1995). Estimating degradation by a Wiener diffusion process subject to measurement error. Lifetime Data Analysis, 1, 307–319.
Whitmore, G. A., & Schenkelberg, F. (1997). Modeling accelerated degradation data using Wiener diffusion with a time scale transformation. Lifetime Data Analysis, 3, 27–45.
Yanagisawa, T., & Kojima, T. (2005). Long-term accelerated current operation of white light-emitting diodes. Journal of Luminescence, 114, 39–42.
Ye, Z. S., & Chen, N. (2014). The inverse Gaussian process as a degradation model. Technometrics, 56, 302–311.
Zhou, Y., Sun, Y., Mathew, J., Wolff, R., & Ma, L. (2011). Latent degradation indicators estimation and prediction: a Monte Carlo approach. Mechanical Systems and Signal Processing, 25, 222–236.
Acknowledgements
This work was supported by the Ministry of Science and Technology (Grant No: MOST-104-2118-M-001-007) of Taiwan, Republic of China. The authors would like to thank Ms. Ya-Shan Cheng for her assistance in the computations.
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Peng, CY., Ai, HF. (2018). Degradation Analysis with Measurement Errors. In: Choi, D., et al. Proceedings of the Pacific Rim Statistical Conference for Production Engineering. ICSA Book Series in Statistics. Springer, Singapore. https://doi.org/10.1007/978-981-10-8168-2_8
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DOI: https://doi.org/10.1007/978-981-10-8168-2_8
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