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Scanning Tunneling Spectroscopy

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Compendium of Surface and Interface Analysis
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Abstract

Spectroscopic measurement performed with STM, referred to as scanning tunneling spectroscopy (STS), provides information proportional to the local density of states (LDOS), the number of states per unit energy, of the sample surface. The STS measurement is usually made by positioning the STM tip over a target feature of a surface, deactivating the feedback loop to fix the STM tip height, applying a sample bias ramp, and recording tunneling current (I) or differential conductance (dI/dV).

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References

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Correspondence to Keisuke Sagisaka .

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Sagisaka, K. (2018). Scanning Tunneling Spectroscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_98

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