Abstract
RBS is a method to determine the absolute elemental composition, usually of thin films (t ~ several tens or hundreds nm) deposited on substrates.
References
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Bragg, W.-H., Kleeman, R.: XXXIX. On the a particle of Radium, and their loss of range in passing through various atoms and molecules, Phil. Mag. Dec. 318–340, (1904)
For example, SIMNRA, (http://home.mpcdf.mpg.de/~mam/)
Huiberts, J.-N., Griessen, R., Rector, J.-H., Wijngaarden, R.-J., Dekker, J.-P., de Groot, D.-G., Koeman, N.-J.: Yttrium and lanthanum hydride films with switchable optical properties. Nature 380, 231–234 (1996)
Sekiba, D., Horikoshi, M., Abe, S., Ishii, S.: Mg segregation in Mg-rich Mg-Ni switchable mirror studied by Rutherford backscattering, elastic recoil detection analysis, and nuclear reaction analysis, J. Appl. Phys. 106, 114912/1–114912/5 (2009)
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Sekiba, D. (2018). Rutherford Backscattering Spectrometry. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_87
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DOI: https://doi.org/10.1007/978-981-10-6156-1_87
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