Abstract
In the RIXS process, a core electron of a particular element is resonantly excited to an unoccupied state by a monochromatized incident X-ray, which is a process called X-ray absorption (XAS).
Change history
13 April 2019
In Chapter “Challenges of Real-Scale Production with Smart Dynamic Casting”, low-resolution Figure 4 is replaced with high resolution, Figure 5 is replaced with new figure and Figure 6 and the graph near are positioned as per the standard.
References
Tokushima, T., Harada, Y., Takata, Y., Sodeyama, K., Tsuneyuki, S., Nagasono, M., Kitajima, Y., Tamenori, Y., Ohashi, H., Hiraya, A., Shin, S.: σ-bonding contribution of a strong π-acceptor molecule: Surface chemical bond of SO2 on Ni(100). Phys. Rev. B 78, 085405/1–085405/5 (2008)
Yamashita, Y., Yamamoto, S., Mukai, K., Yoshinobu, J., Harada, Y., Tokushima, T., Takeuchi, T., Takata, Y., Shin, S., Akagi, K., Tsuneyuki, S.: Direct observation of site-specific valence electronic structure at the SiO2/Si interface. Phys. Rev. B 73, 045336/1-045336/4 (2006)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Harada, Y. (2018). Resonant Inelastic X-Ray Scattering. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_86
Download citation
DOI: https://doi.org/10.1007/978-981-10-6156-1_86
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-6155-4
Online ISBN: 978-981-10-6156-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)