Abstract
Reflection High-Energy Electron Diffraction (RHEED) (Ichimiya and Cohen in Reflection high-energy electron diffraction, Cambridge University Press, Cambridge, 2004 [1]) is one of the powerful methods for surface structural analysis.
This is a preview of subscription content, log in via an institution.
References
Ichimiya, A., Cohen, P.I.: Reflection high-energy electron diffraction. Cambridge University Press, Cambridge, UK (2004)
Joyce, B.A., Dobson, P.J., Neave, J.H., Woodbridge, K., Zhang, J., Larsen, P.K., Bolger, B.: RHEED studies of heterojunction and quantum well formation during MBE growth—from multiple scattering to band offsets. Surf. Sci. 168, 423–438 (1986)
Horio, Y.: Zero-loss reflection high-energy electron diffraction patterns and rocking curves of the Si(111) 7 × 7 surface obtained by energy filtering. Jpn. J. Appl. Phys. 35, 3559–3564 (1996)
Horio, Y.: Structure analysis of Si(111) √3 × √3—A1 surface by energy-filtered RHEED. Surf. Rev. Lett. 4, 977–983 (1997)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Horio, Y. (2018). Reflection High-Energy Electron Diffraction. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_85
Download citation
DOI: https://doi.org/10.1007/978-981-10-6156-1_85
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-6155-4
Online ISBN: 978-981-10-6156-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)