Abstract
Ferroelectric material generates an electric charge when pressure is applied. Also, it will expand and contract when a voltage is applied. In Piezoresponse Force Microscope (PFM), a conductive cantilever is used to apply a voltage to a local region of a ferroelectric material, and distortion caused by the piezoelectric effect of the ferroelectric material is detected as a deflection of the cantilever and imaged (Gruverman in Appl Phys Lett 69:3191–3193, 1996 [1]). In the measurement, the polarized state of the sample is measured with respect to the AC voltage applied between the sample and the probe by whether the relationship between expansion and contraction of the sample strain is in-phase or reversed (Fig. 80.1). Piezoelectric response of ferroelectric material of nm order can be detected. PFM is a useful technique for local polarization/phase transition of ferroelectric material, observation of domain boundary, and so on.
References
Gruverman, A., Auciello, O., Tokumoto, H.: Nanoscale investigation of fatigue effects in Pb(Zr, Ti)O3 films. Appl. Phys. Lett. 69, 3191–3193 (1996)
It was provided by Okamura laboratory of Tokyo University of Science
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Hirade, M. (2018). Piezoresponse Force Microscope. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_80
Download citation
DOI: https://doi.org/10.1007/978-981-10-6156-1_80
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-6155-4
Online ISBN: 978-981-10-6156-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)