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Particle-Induced X-Ray Emission

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Compendium of Surface and Interface Analysis

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Abstract

PIXE was first proposed by Sven Johansson in 1970 [1]. This method of analysis is based on the emission of characteristic X-rays from a sample after inner-shell ionization with ions from accelerators. In comparison to other analytical techniques based on X-ray spectrometry, such as EPMA and XRF, the ion beams generate fewer continuous X-rays, which dwarf the trace element peaks. Thus, it has an excellent sensitivity down to the ppm level for solids and the ppb level for liquids.

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References

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Authors and Affiliations

  1. Cyclotron Research Center, Iwate Medical University, Takizawa, Iwate, Japan

    Koichiro Sera

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  1. Koichiro Sera
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Correspondence to Koichiro Sera .

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  1. Tokyo, Japan

    The Surface Science Society of Japan

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Sera, K. (2018). Particle-Induced X-Ray Emission. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_70

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