Abstract
Low-energy ions scattering (less than 5 keV) is a powerful tool for the analysis of “first monolayer”.
References
Rabalais, J.W.: Low Energy Ion-Surface Interactions. Wiley, NewYork (1994)
Rabalais, J.W.: Principles and Applications of Ion Scattering Spectroscopy. Wiley, New York (2003)
Buck, T.M., Wheatley, G.H., Verheij, L.K.: Low energy neon ion scattering and neutralization on first and second layers of a Ni(001) surface. Surf. Sci. 90, 635–647 (1979)
Katayama, M., Nomura, E., Kanekama, N., Soejima, H., Aono, M.: Coaxial impact-collision ion scattering spectroscopy (CAICISS): a novel method for surface structure analysis. Nucl. Instrum. Meth. Phys. Res. B 33, 857–861 (1988)
Sumitomo, K., Oura, K., Katayama, I., Shoji, F., Hanawa, T.: “A TOF-ISS/ERDA apparatus for solid surface analysis”, “Coaxial impact-collision ion scattering spectroscopy (CAICISS): a novel method for surface structure analysis”. Nucl. Instrum. Meth. Phys. Res. B 33, 871–875 (1988)
Souda, R., Aono, M.: Interactions of low energy He+, He0 and He* with solid surfaces. Nucl. Instrum. Meth. Phys. Res. B 15, 114–121 (1986)
Umezawa, K., Nakanishi, S., Yoshimura, M., Ojima, K., Ueda, K., Gibson, W.M.: Ag/Cu(111) surface structure and metal epitaxy by impact-collision ion-scattering spectroscopy and scanning tunneling microscopy. Phys. Rev. B 63, 035402 (2000)
Williams, R., Kato, M., Daley, R.S., Aono, M.: Scattering cross sections for ions colliding sequentially with two target atoms. Surf. Sci. 225, 355–366 (1990)
Robinson, M.T., Yorrens, I.M.: Computer simulation of atomic displacement cascades in solids in the binally-collision approximation, Phys. Rev. B9, 5008–5024 (1974)
Yuan, B., Yu, F.C., Tang, S.M.: A database method for binary atomic scattering angle calculation. Nucl. Instrum. Meth. B83, 413–418 (1993)
Denier van der Gon, A.W., Smith, R.J., Gay, J.M., O’Connor, D.J., van der Veen, J.F.: Melting of Al surfaces. Surf. Sci. 227, 143–149 (1990)
Nieus, H.: Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structural analysis. Appl. Phys. A 53, 388–402 (1991)
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Umezawa, K. (2018). Low-Energy Ion Scattering Spectroscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_56
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DOI: https://doi.org/10.1007/978-981-10-6156-1_56
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