Abstract
In lateral force microscopy, not only the topographic image of the sample surface but also the distribution image of the lateral force in the same area can be gotten simultaneously.
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References
Ogletree, D.F., Carpick, R.W., Salmeran, M.: Calibration of frictional forces in atomic force microscopy. Rev. Sci. Instrum. 67, 3298 (1996)
Matsumoto, N., Kobayashi, K.: Investigation of Relevance of the Environment in Friction Force Measurement. Kyoto University FY2003 Nanotechnology Support Project Report. 049 (2003)
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Moriguchi, S. (2018). Lateral Force Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_54
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DOI: https://doi.org/10.1007/978-981-10-6156-1_54
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