Abstract
Laser SNMS is a mass-selective surface imaging technique based on photo-ionization of sputtered neutrals originated in an ion beam irradiation on a solid sample. Atoms, occasionally molecules, are promoted and ionized through photon absorption.
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Sakamoto, T., Koizumi, M.: Resonance enhanced multi-photon ionization of neutral atoms sputtered with Ga-FIB. Appl. Surf. Sci. 255, 901–904 (2008)
Sakamoto, T., A new aspect of Laser-SNMS coupled with Ga FIB for polymer analysis, proceedings of SISS-15, 81–82 (2013)
Ishikawa, T., Kashiwagi, T., Sakamoto, T., Misawa, K., Fujii, M., Hachiya, M., Noda, H., Endo, K.: Development of a Laser-SNMS instrument for nanoscale analysis and mapping of organic materials. Hyomen-Kagaku. 35, 383–388 (2014). (in Japanese)
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Sakamoto, T. (2018). Laser Ionization Secondary Neutral Mass Spectrometry. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_52
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DOI: https://doi.org/10.1007/978-981-10-6156-1_52
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