Abstract
A high electric field of greater than 0.5 V/Å can be generated over the apex of a sharpened metallic needle (tip) with a radius of less than 100 nm, by application of a voltage of higher than a few kV to the tip.
This is a preview of subscription content, log in via an institution.
Change history
13 April 2019
In Chapter “Challenges of Real-Scale Production with Smart Dynamic Casting”, low-resolution Figure 4 is replaced with high resolution, Figure 5 is replaced with new figure and Figure 6 and the graph near are positioned as per the standard.
References
Tsong, T.T.: Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution. Cambridge University Press, Cambridge (1990)
Miller, M.K., Smith, G.D.W.: Atom Probe Microanalysis: Principles and Applications to Materials Problems. Materials Research Society, Pittsburgh (1989)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Tomitori, M. (2018). Atom Probe Field Ion Microscope. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_5
Download citation
DOI: https://doi.org/10.1007/978-981-10-6156-1_5
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-10-6155-4
Online ISBN: 978-981-10-6156-1
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)