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Compendium of Surface and Interface Analysis pp 821–825Cite as

X-Ray Crystal Truncation Rod Scattering

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Abstract

X-ray CTR scattering is a rod-shaped X-ray scattering appearing in the direction perpendicular to a crystalline surface (Fig. 130.1a) (Feidenhans’l in Surf Sci Rep 10:105–188, 1989[1]). Sharp truncation of the electron density of crystalline materials at the surface results in the CTRs.

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References

  1. Feidenhans’l, R.: Surface structure determination by X-ray diffraction. Surf. Sci. Rep. 10, 105–188 (1989)

    Article  CAS  Google Scholar 

  2. Robinson, I.K.: Crystal truncation rods and surface roughness. Phys. Rev. B 33, 3830–3836 (1986)

    Article  CAS  Google Scholar 

  3. Bloch, J.M.: Angle and index calculated for ‘z-Axis’ diffractometer. J. Appl. Cryst. 18, 33–36 (1985)

    Article  CAS  Google Scholar 

  4. Evans-Lutterodt, K.W., Tang, M.-T.: Angle Calculations for a ‘2 + 2’ surface X-ray diffractometer. J. Appl. Cryst. 28, 318–326 (1995)

    Article  CAS  Google Scholar 

  5. Vlieg, E.: A (2 + 3)-type surface diffractometer: mergence of the z-Axis and (2 + 2)-type geometries. J. Appl. Cryst. 31, 198–203 (1998)

    Article  CAS  Google Scholar 

  6. Matsushita, T., Takahashi, T., Shirasawa, T., Arakawa, E., Toyokawa, H., and Tajiri, H.: Quick measurement of crystal truncation rod profiles in simultaneous multi-wavelength dispersive mode. J. Appl. Phys. 110, (2011). 102209/1–102209/8

    Article  Google Scholar 

  7. Gustafson, J., Shipilin, M., Zhang, C., Stierle, A., Hejral, U., Ruett, U., Gutowski, O., Carlsson, P.-A., Skoglundh, M., Lundgren, E.: High-energy surface X-ray diffraction for fast surface structure determination. Science 343, 758–761 (2014)

    Article  CAS  Google Scholar 

  8. Willmott, P.R., Pauli, S.A., Herger, R., Schlepütz, C.M., Martoccia, D., Patterson, B.D., Delley, B., Clarke, R., Kumah, D., Cionca, C., and Yacoby, Y.: Structural basis for the conducting interface between LaAlO3 and SrTiO3. Phys. Rev. Lett. 99, 155502/1–155502/4 (2007)

    Google Scholar 

  9. Morisaki, H., Koretsune, T., Hotta, C., Takeya, J., Kimura, T., and Wakabayashi, Y.: Large surface relaxation in the organic semiconductor tetracne. Nat. Commun. 5, 5400/1–5400/6 (2014)

    Google Scholar 

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  1. National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Ibaraki, Japan

    Tetsuroh Shirasawa

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  1. Tetsuroh Shirasawa
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Correspondence to Tetsuroh Shirasawa .

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  1. Tokyo, Japan

    The Surface Science Society of Japan

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Shirasawa, T. (2018). X-Ray Crystal Truncation Rod Scattering. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_130

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