Abstract
Monochromatic or non-monochromatic X-rays from an X-ray tube or a synchrotron radiation beamline impinge on a flat surface at a glancing angle less than the critical angle of X-ray total reflection (usually around 0.1°), and the incident X-rays are totally reflected by the flat surface. The electric field of the incident X-rays exists at the surface from the top layer to a few nanometer depth. This electric field is called an evanescent wave. This electric field of X-rays ionizes an inner-shell electron, and consequently, X-ray fluorescence is emitted. The X-ray fluorescence (XRF) is a term refers to the characteristic X-ray emission due to X-ray excitation.
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Kawai, J. (2018). Total Reflection X-Ray Fluorescence. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_122
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DOI: https://doi.org/10.1007/978-981-10-6156-1_122
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