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Compendium of Surface and Interface Analysis pp 749–753Cite as

Time-Resolved Scanning Tunneling Microscopy

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Abstract

Since the invention of scanning tunneling microscopy (STM) in 1982, the addition of high time resolution to STM has been the most challenging issue, and various time-resolved STM (TR-STM) methods have been considered and developed (Terada et al. in J Phys Condens Matter 22:264008–264015, 2010, Loth et al. in Science 329:1628–1630, 2010 [1, 2]).

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References

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Authors and Affiliations

  1. Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan

    Hidemi Shigekawa

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  1. Hidemi Shigekawa
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Correspondence to Hidemi Shigekawa .

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  1. Tokyo, Japan

    The Surface Science Society of Japan

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Shigekawa, H. (2018). Time-Resolved Scanning Tunneling Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_120

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