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Surface Profilometer

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Compendium of Surface and Interface Analysis
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Abstract

Surface profilometer can measure profile of surface roughness, surface texture, surface waviness, surface step height, deposited thin film thickness, and so on by means of contacting and scanning a sharp stylus with a very small measurement force less than mN.

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  • 13 April 2019

    In Chapter “Challenges of Real-Scale Production with Smart Dynamic Casting”, low-resolution Figure 4 is replaced with high resolution, Figure 5 is replaced with new figure and Figure 6 and the graph near are positioned as per the standard.

Reference

  1. Kasahara, A., Kim, Y.S., Tosa, M., Yoshihara, K.: Measurement of friction force in a high vacuum. J. Vac. Soc. Jpn. 43, 986–991 (2000)

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Correspondence to Masahiro Tosa .

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© 2018 Springer Nature Singapore Pte Ltd.

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Tosa, M. (2018). Surface Profilometer. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_110

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