Abstract
Surface profilometer can measure profile of surface roughness, surface texture, surface waviness, surface step height, deposited thin film thickness, and so on by means of contacting and scanning a sharp stylus with a very small measurement force less than mN.
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13 April 2019
In Chapter “Challenges of Real-Scale Production with Smart Dynamic Casting”, low-resolution Figure 4 is replaced with high resolution, Figure 5 is replaced with new figure and Figure 6 and the graph near are positioned as per the standard.
Reference
Kasahara, A., Kim, Y.S., Tosa, M., Yoshihara, K.: Measurement of friction force in a high vacuum. J. Vac. Soc. Jpn. 43, 986–991 (2000)
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Tosa, M. (2018). Surface Profilometer. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_110
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DOI: https://doi.org/10.1007/978-981-10-6156-1_110
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Online ISBN: 978-981-10-6156-1
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