Abstract
Spin-polarized scanning electron microscopy (spin SEM) is a method to visualize magnetization distribution at the surface of a ferromagnetic sample [1–4], whose principle is summarized in Fig. 102.1.
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Koike, K., Hayakawa, K.: Scanning electron microscope observation of magnetic domains using spin-polarized secondary electrons. Jpn. J. Appl. Phys. 23, L187–L188 (1984)
Unguris, J., Hembree, G.G., Celotta, R.J., Pierce, D.T.: High resolution magnetic microstructure imaging using secondary electron spin polarization analysis in a scanning electron microscope. J. Microsc. 139, RP1–RP2 (1985)
Oepen, H.P., Kirschner, J.: Imaging of magnetic microstructures at surfaces: the scanning electron microscope with spin polarization analysis. Scan. Microsc. 5, 1–16 (1991)
Allenspach, R.: Ultrathin films: magnetism on the microscopic scale. J. Magn. Magn. Mater. 129, 160–185 (1994)
Mott, N.F.: The scattering of fast electrons by atomic nuclei. Proc. R. Soc. London Ser. A 124, 425–442 (1929)
Koike, K.: Spin-polarized scanning electron microscopy. Microscopy 62, 177–191 (2013)
Kohashi, T., Konoto, M., Koike, K.: High-resolution spin-polarized scanning electron microscopy (spin SEM). J. Electron Microsc. 59, 43–52 (2010)
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Kohashi, T. (2018). Spin-Polarized Scanning Electron Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_102
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DOI: https://doi.org/10.1007/978-981-10-6156-1_102
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