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Improvement of the specimen heating device for the electron microscope

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Verhandlungen

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Abstract

A specimen heating device for the electron microscope (1, 2) has previously been reported by us in detail, and some results (1, 2, 3, 4) were obtained applying this device. Recently, as the methods of preparing thin films of the specimen itself (5, 6, 7, 8) have made progresses, its utility has increased. But this specimen heating device for the electron microscope is not satisfactory in the following points.

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References

  1. Itoh, K., T. Itoh and M. Watanabe: Proc. int. Conf. Electron. Microscopy, London 1954, p. 658 (1956).

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  2. Takahashi, N., T. Takeyama, K. ITO, T. ITo; K. Mihama and M. Watanabe: J. Electronmicroscopy (Jap.) 4, 16 (1956).

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  3. Takahashi, N., T. Takeyama, K. Ito, T. Ito; K. Mihama and M. Watanabe, and K. Mihama: Acta metallurg. 5, 159 (1957).

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  4. Takahashi, N., T. Takeyama, K. Ito, T. Ito; K. Mihama and M. Watanabe, and K. Mihama, and K. Ashinuma: J. Electronmicroscopy (Jap.) 6, 29 (1958).

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  5. Heioenreich, R. D.: J. appl. Physics 20, 993 (1949).

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  6. Castaing, R.: Revue metallurg. 52, 669 (1955).

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  7. Bollmann, W.: Proc. Stockholm Conference on Electron Microscopy (1956) 316.

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  8. Takahashi, N., K. Ashinuma and M. Watanabe: J. Electronmicroscopy (Jap.) 5, 22 (1957).

    Google Scholar 

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Authors and Affiliations

  1. Japan Electron Optics Lab. Co. Ltd., Tokyo, Japan

    I. Okazaki, M. Watanabe & K. Mihama

Authors
  1. I. Okazaki
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  2. M. Watanabe
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  3. K. Mihama
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Editor information

W. Bargmann G. Möllenstedt H. Niehrs D. Peters E. Ruska C. Wolpers

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© 1960 Springer-Verlag Berlin Heidelberg

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Okazaki, I., Watanabe, M., Mihama, K. (1960). Improvement of the specimen heating device for the electron microscope. In: Bargmann, W., Möllenstedt, G., Niehrs, H., Peters, D., Ruska, E., Wolpers, C. (eds) Verhandlungen. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-01991-7_30

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  • DOI: https://doi.org/10.1007/978-3-662-01991-7_30

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-01696-1

  • Online ISBN: 978-3-662-01991-7

  • eBook Packages: Springer Book Archive

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