Abstract
We present two approaches to segment metallic phases in images of lead free solder joints. We compare the results of a method without user interaction with another one extrapolating information from a relatively small set of user labeled pixels. The segmented images provide statistical data of spatial characteristics of phases to serve as input in numerical models of solder joints.
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Sivasubramaniam, V., Galli, M., Cugnoni, J., Janczak-Rusch, J., Botsis, J.: A study of the shear response of a lead-free composite solder by experimental and homogenization techniques. Journal of Electronic Materials 38(10), 2122–2131 (2009)
Sidhu, R.S., Chawla, N.: Three-dimensional (3D) visualization and microstructure-based modeling of deformation in a Sn-rich solder. Scripta Materialia 54(9), 1627–1631 (2006)
Erinc, M., Assman, T., Schreurs, P., Geers, M.: Fatigue fracture of SnAgCu solder joints by microstructural modeling. International Journal of Fracture 152(1), 37–49 (2008)
Kang, S.K., Choi, W.K., Shih, D., Henderson, D.W., Gosselin, T., Sarkhel, A., Goldsmith, C., Puttlitz, K.J.: Ag3Sn plate formation in the solidification of near-ternary eutectic Sn-Ag-Cu. JOM Journal of the Minerals, Metals and Materials Society 55(6), 61–65 (2003)
Ibrahim, A., Tominaga, S., Horiuchi, T.: Material classification for printed circuit boards by spectral imaging system. In: Trémeau, A., Schettini, R., Tominaga, S. (eds.) CCIW’09. LNCS, vol. 5646, pp. 216–225. Springer, Heidelberg (2009)
Vapnik, V.N.: The Nature of Statistical Learning Theory. Springer, New York (1995)
Bruzzone, L., Carlin, L., Melgani, F.: A Multilevel Hierarchical Approach to Classification of High Spatial Resolution Images with Support Vector Machines. In: Proceedings of IGARSS, IEEE International Geoscience and Remote Sensing Symposium, pp. 540–543 (2004)
Jain, A.K.: Fundamentals of digital image processing. Prentice-Hall, Englewood Cliffs (1989)
Young, I.T., Zagers, R., van Vliet, L.J., Mullikin, J., Boddeke, F., Netten, H.: Depth-of-Focus in Microscopy. In: Proc. 8th Scandinavian Conference on Image Analysis, SCIA, Tromso, Norway, pp. 493–498 (1993)
Chapelle, O., Haffner, P., Vapnik, V.N.: Support Vector Machines for Histogram-Based Image Classfication. IEEE Transactions on Neural Networks 10(5) (1999)
Jian, M., Guo, H., Liu, L.: Texture image classification using visual perception texture features and Gabor wavelet features. Journal of Computers 4(8), 763–770 (2009)
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Scheller Lichtenauer, M., Avelar, S., Toporek, G. (2010). Segmentation of Images of Lead Free Solder. In: Elmoataz, A., Lezoray, O., Nouboud, F., Mammass, D., Meunier, J. (eds) Image and Signal Processing. ICISP 2010. Lecture Notes in Computer Science, vol 6134. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-13681-8_20
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DOI: https://doi.org/10.1007/978-3-642-13681-8_20
Publisher Name: Springer, Berlin, Heidelberg
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