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Characterization of Textured Structures

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Spectroscopic Ellipsometry for Photovoltaics

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 214))

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Abstract

Various textured structures have been incorporated into photovoltaic devices to improve the short-circuit current density based on optical confinement effects. Although intense light scattering occurs in textured structures , spectroscopic ellipsometry (SE) characterization can still be made even for textured single crystalline Si (c-Si) having a pyramid size of ~10 μm. Depending on the texture size, however, different measurements and analytical approaches need to be used. It has been demonstrated that high-precision SE characterization of submicron-size rough structures can be carried out by employing advanced optical models, including (i) effective-medium-approximation multilayer model and (ii) surface area model. From such SE analyses, structural non-uniformities in large-area solar cell modules can further be determined. In this chapter, we review SE characterization performed for textured structures in c-Si heterojunction, Si thin-film and Cu(In,Ga)Se2 solar cells.

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Authors and Affiliations

  1. Gifu University, 1-1 Yanagido, 501-1193, Gifu, Japan

    Hiroyuki Fujiwara & Yuichiro Sago

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  1. Hiroyuki Fujiwara
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  2. Yuichiro Sago
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Correspondence to Hiroyuki Fujiwara .

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Editors and Affiliations

  1. Department of Electrical, Electronic and Computer Engineering, Gifu University, Gifu, Japan

    Hiroyuki Fujiwara

  2. Department of Physics and Astronomy, The University of Toledo, Toledo, OH, USA

    Robert W. Collins

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Fujiwara, H., Sago, Y. (2018). Characterization of Textured Structures. In: Fujiwara, H., Collins, R. (eds) Spectroscopic Ellipsometry for Photovoltaics. Springer Series in Optical Sciences, vol 214. Springer, Cham. https://doi.org/10.1007/978-3-319-95138-6_4

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