Abstract
The functional behavior of an electronic device is represented by an idealized circuit. Undesired parasitic interactions, such as electromagnetic-compatibility (EMC) problems, are modeled by additional lumped elements in the circuit. Device design parameters, e.g. partial inductances, must be optimized to improve EMC. This paper presents a sensitivity analysis method which relates changes to circuit parameters to changes to 3D model parameters.
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Acknowledgements
The π-filter model used in Sect. 4.3.3 was kindly provided by Dr. Christoph Keller, Robert Bosch GmbH (CR/ARE1).
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Schuhmacher, S., Potratz, C., Klaedtke, A., De Gersem, H. (2018). Sensitivity of Lumped Parameters to Geometry Changes in Finite Element Models. In: Langer, U., Amrhein, W., Zulehner, W. (eds) Scientific Computing in Electrical Engineering. Mathematics in Industry(), vol 28. Springer, Cham. https://doi.org/10.1007/978-3-319-75538-0_4
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DOI: https://doi.org/10.1007/978-3-319-75538-0_4
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