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Introduction: Interfaces as an Object of Photoemission Spectroscopy

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Book cover Spectroscopy of Complex Oxide Interfaces

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 266))

Abstract

In this short introductory chapter, basic concepts of photoemission techniques will be given. In particular, the importance of some parameters like probing depth, energy and momentum resolution will be tackled by comparing photoemission experiments in different photon energy ranges from ultraviolet to soft and hard X-rays. Buried system i.e. interfaces could be probed only by using high energy photoemission. Apart from the band structure resolved in electron momentum k, the photoemission technique directly probes the electron spectral function encoding information about how particles are dressed by their interactions with the remainder of the system. Many body effects and electron correlation can in this way be accessed, in particular, the electron-phonon interaction affecting electron mobility. Finally, the instrumental development of photoemission is described in connection with its scientific perspective.

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Author information

Authors and Affiliations

  1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Joining Technologies and Corrosion, Dübendorf, Switzerland

    C. Cancellieri

  2. Paul Scherrer Institut, SLS, Villigen, Switzerland

    Vladimir N. Strocov

Authors
  1. C. Cancellieri
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  2. Vladimir N. Strocov
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Correspondence to C. Cancellieri .

Editor information

Editors and Affiliations

  1. Empa—Swiss Federal Laboratories for Materials Science and Technology, Dübendorf, Switzerland

    Claudia Cancellieri

  2. Spectroscopy of Novel Materials Group, Paul Scherrer Institute, Villigen, Switzerland

    Vladimir N. Strocov

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Cancellieri, C., Strocov, V.N. (2018). Introduction: Interfaces as an Object of Photoemission Spectroscopy. In: Cancellieri, C., Strocov, V. (eds) Spectroscopy of Complex Oxide Interfaces. Springer Series in Materials Science, vol 266. Springer, Cham. https://doi.org/10.1007/978-3-319-74989-1_1

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