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Real-Time Multi-class Instance Segmentation with One-Time Deep Embedding Clustering

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Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 12046))

Abstract

In recent years, instance segmentation research has been considered as an extension of object detection and semantic segmentation, which can provide pixel-level annotations on detected objects. Several approaches for instance segmentation exploit object detection network to generate bounding box and segment each bounding box with segmentation network. However, these approaches need more time consumption due to two independent networks as their framework. On the other hand, some approaches based on clustering transform each pixel into unique representation and produce instance mask by postprocessing. Nevertheless, most clustering approaches have to cluster all instances of each class individually, which contribute to additional time consumption. In this research, we propose a fast clustering method called one-time clustering with single network aiming at reducing time consumption on multi-class instance segmentation. Moreover, we present a class-sensitive loss function that allows the network to generate unique embedding which contains class and instance information. With the informative embeddings, we can cluster them only once instead of clustering for each class in other clustering approaches. Our approach is up to 6x faster than the state-of-the-art UPSNet [1], which appeared in CVPR 2019, and get about 25% lower AP performance on Cityscape dataset. It achieves significantly faster speed and great segmentation quality while having an acceptable AP performance.

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Correspondence to Li-Chen Fu .

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Chen, YC., Chang, CY., Hsiao, PY., Fu, LC. (2020). Real-Time Multi-class Instance Segmentation with One-Time Deep Embedding Clustering. In: Palaiahnakote, S., Sanniti di Baja, G., Wang, L., Yan, W. (eds) Pattern Recognition. ACPR 2019. Lecture Notes in Computer Science(), vol 12046. Springer, Cham. https://doi.org/10.1007/978-3-030-41404-7_16

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  • DOI: https://doi.org/10.1007/978-3-030-41404-7_16

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-41403-0

  • Online ISBN: 978-3-030-41404-7

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