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Advanced Computing in Electron Microscopy pp 99–141Cite as

Calculation of Images of Thin Specimens

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Abstract

This chapter presents approximate methods of calculating transmission electron microscope images of thin specimens. The thickness of the specimen is ignored, which may be appropriate for very thin specimens. Multiple scattering is also generally ignored. This approach is intermediate between the transfer function (in previous chapters) and the multislice and Bloch wave methods (discussed in later chapters) and has the advantage of requiring much less computer time.

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Authors and Affiliations

  1. School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA

    Earl J. Kirkland

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Kirkland, E.J. (2020). Calculation of Images of Thin Specimens. In: Advanced Computing in Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-030-33260-0_5

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