Abstract
Circuit performance metrics depend on several design and process parameters of the components of the circuit. This relationship can often be quite nonlinear and in a high-dimensional space resulting from high parameter counts. We look at a response surface modeling approach that models this relationship effectively by extracting the dominant latent variables in the input space that primarily influence the performance metric. The approach is reminiscent of project pursuit, but applies that technique via a carefully crafted neural network architecture. The neural network in this case is grown dynamically in stages, where each stage extracts the next dominant latent variable and models the relationship between the performance metrics and that latent variable.
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Singhee, A. (2019). SiLVR: Projection Pursuit for Response Surface Modeling. In: Elfadel, I., Boning, D., Li, X. (eds) Machine Learning in VLSI Computer-Aided Design. Springer, Cham. https://doi.org/10.1007/978-3-030-04666-8_16
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DOI: https://doi.org/10.1007/978-3-030-04666-8_16
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