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LEEM, SPLEEM and SPELEEM

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Abstract

This chapter discusses some of the most important imaging methods with low-energy electrons, including: low-energy electron microscopy ( ), its extension to spin-polarized low-energy electron microscopy ( ), and its combination with spectroscopic photoemission and low-energy electron microscopy ( ). Other imaging methods mentioned only briefly in the chapter include ultraviolet photoemission electron microscopy ( ), mirror electron microscopy () , low-electron energy loss microscopy ( ), and Auger electron emission microscopy ( ). The instruments used in these imaging methods allow imaging not only in real space but also in reciprocal space, such as low-energy electron diffraction ( ) and angle-resolved photoelectron spectroscopy (ARPES in SPELEEM). The combination of these methods with complementary high-lateral-resolution methods renders imaging with low-energy electrons a comprehensive surface analysis tool.

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The author thanks Anastassia Pavlovska for preparing the figures, references, permissions and for the editorial work of this chapter.

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Bauer, E. (2019). LEEM, SPLEEM and SPELEEM. In: Hawkes, P.W., Spence, J.C.H. (eds) Springer Handbook of Microscopy. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-00069-1_9

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