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Introduction

  • Chapter
Surface Infrared and Raman Spectroscopy

Part of the book series: Methods of Surface Characterization ((MOSC,volume 3))

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Abstract

The knowledge of the submicroscopic structure of surfaces, adsorbed layers, deposited surface films, and interfaces is of importance for the fundamental understanding of physical, mechanical, and chemical properties of solid materials. At the same time, such information is valuable in a number of technological fields, such as semiconductor technology, catalysis, lubrication, corrosion and its inhibition, metal finishing, adhesion, printing, and electrochemical technology. Vibrational spectroscopy, which has historically provided chemists, physicists, and engineers with incisive information about the chemical species present on surfaces, is one of the major surface analytical methods widely used today. This book describes a wide variety of vibrational methods and probes.

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Author information

Authors and Affiliations

  1. Tohoku University, Tsuchiura, Japan

    Professor W. Suëtaka

  2. Surface Science Center, University of Pittsburgh, Pittsburgh, Pennsylvania, USA

    John T. Yates Jr.

Authors
  1. Professor W. Suëtaka
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  2. John T. Yates Jr.
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© 1995 Springer Science+Business Media New York

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Suëtaka, W., Yates, J.T. (1995). Introduction. In: Surface Infrared and Raman Spectroscopy. Methods of Surface Characterization, vol 3. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0942-8_1

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  • DOI: https://doi.org/10.1007/978-1-4899-0942-8_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-0944-2

  • Online ISBN: 978-1-4899-0942-8

  • eBook Packages: Springer Book Archive

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