Abstract
Static SIMS has been used to characterize the surfaces of a variety of commercial polyimides and of the interfaces between a polyimide of the PMDA-ODA type and evaporated films of copper and chromium. The commercial materials were all contaminated with organic and inorganic materials: the most common one is a free anhydride. The spectra obtained from the metal-PI interfaces are initially different for Cu and Cr but become identical after a post-deposition annealing treatment. A possible mechanism for the metal-polymer interaction based on the SIMS results is presented.
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© 1989 Springer Science+Business Media New York
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van Ooij, W.J., Brinkhuis, R.H.G., Park, J.M. (1989). A Static SIMS Study of Interfaces between Evaporated Metal Films and Polyimides. In: Mittal, K.L., Susko, J.R. (eds) Metallized Plastics 1. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0879-7_12
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DOI: https://doi.org/10.1007/978-1-4899-0879-7_12
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