Abstract
A dichotomy affects the approach to the manufacture of integrated circuits. Some manufacturers aim for “zero defects,” while others are deeply involved in using circuits with fault-tolerance. For either approach, future manufacturing facilities require extensive defect learning. The methodology for establishing defect learning objectives far into the future is the topic of this paper.
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© 1990 Springer Science+Business Media New York
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Stapper, C.H. (1990). Fault-Free or Fault-Tolerant VLSI Manufacture. In: Stapper, C.H., Jain, V.K., Saucier, G. (eds) Defect and Fault Tolerance in VLSI Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9957-6_1
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DOI: https://doi.org/10.1007/978-1-4757-9957-6_1
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