Abstract
In this paper, novel applications of atomic force microscopy (AFM) to optical fiber research are reviewed. Three specific examples are presented, illustrating the effective use of AFM to advance our understanding of material structure and properties in optical fibers. Existing issues and the need for innovation in applications of AFM to new material systems are also discussed.
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© 1997 Springer Science+Business Media New York
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Zhong, Q., Inniss, D. (1997). Applications of Atomic Force Microscopy in Optical Fiber Research. In: Cohen, S.H., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9325-3_20
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DOI: https://doi.org/10.1007/978-1-4757-9325-3_20
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-9327-7
Online ISBN: 978-1-4757-9325-3
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