Abstract
Over the last decade rapid growth has occurred in the variety of scanned probe techniques available.1 The vast array of familiar reciprocal space probes is now joined by a multitude of real space probes. The relatively new ability to observe real space properties of systems at microscopic-length scales has found wide applicability across the physical sciences, from physics and chemistry to biology, with no end in sight. Much of this advancement has been made possible by the ready availability of commercial instruments operating in air, liquid, and vacuum. One can now even purchase high performance combined STM/AFM devices, tailored to a particular application. Despite this rapid advancement, however, there still exists a feeling that the fields of scanned probe microscopy are in their infancy, perhaps with the best yet to come. New techniques continue to be developed, and a new philosophy of experimentation has begun to take shape. Rather than just use scanned probe instruments as passive tools of surface characterization, researchers are increasingly using them to intentionally modify the systems under study. This change brings with it a great many new possibilities.
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References
R. Wiesendanger and N.J. Guntherodt, eds., “Scanning Tunneling Microscopy,” Springer-Verlag, New York (1993).
G. Binnig, H. Rohrer, C. Gerber and E. Weibel_ 7x7 Reconstruction on Si(1 l I) resolved in real space, Phys. Rev. Lett. 50: 120–123 (1983).
R. M. Feenstra, J. A. Stroscio, J. Tersoff and A. P. Fein, Atom-selective imaging of the GaAs(110) surface, Phys. Rev. Lett. 58: 1192–1195 (1987).
R.M. Tromp, R.J. Hamers and J.E. Demuth, Si(001) dimer structure observed with scanning tunneling microscopy, Phys. Rev. Lett. 55: 1303–1306 (1985).
J.A. Stroscio and W. J. Kaiser, eds., “Scanning Tunneling Microscopy,” Academic Press, Inc., San Diego (1993).
M.B. Johnson, P.M. Koenraad, W.C. v. d. Vleuten, H.W.M. Salemink and.CN.Wolter, Be delta-doped layers in GaAs imaged with atomic resolution using scanning tunneling microscopy, Phys. Rev. Lett. 75: 1606 (1995).
C. Woll, S. Chiang, R. J. Wilson and P.H. Lippel, Determination of atom positions at stacking-fault dislocations on Au(111) by scanning tunneling microscopy, Phys. Rev. B 39: 7988–7991 (1988).
M. F. Crommie, C. P. Lutz and D. M. Eigler, Imaging standing waves in a two-dimensional electron gas, Nature 363: 524–527 (1993).
D. D. Chambliss and R. J. Wilson, Relaxed diffusion limited aggregation of Ag on Au(11 l) observed by scanning tunneling microscopy, J. Vac. Sci. B 9: 2 928–932 (1991).
l0. D. Kandel and E. Kaxiras, Surfactant mediated crystal growth of semiconductiors, Phys. Rev. Lett. 75: 2742 (1995).
J. A. Meyer, J. Vrijmoeth and R.J. Behm, Importance of the additional step-edge barrier in determining film morphology during epitaxial growth, Phys. Rev. B 51: 14790 (1995).
H. Brune, H. Roder and K. Kern, Kinetic processes in metal epitaxy studied with variable temperature STM: AG/Pt (111), Thin solid films 264: 230 (1995).
E.A. Eklund, E.J. Snyder and R.S. Williams, Correlation from randomness: quantitative analysis of ion-etched graphiste surfaces using the scanning tunneling microscope, Surface Science 285: 157 (1993).
R.V. Coleman, Z. Dai and W.W. Mcnairy, Surface structure and spectroscopy of charge-density wave materials using scanning tunneling microscopy, Applied Surface Science 60, 485 (1992).
R. E. Thomson, B. Burk and A. Zettl, Scanning tunneling microscopy of the charge-density-wave structure in IT-TaS2, Phys. Rev. B 49, 16899–16916 (1994).
H. F. Hess, R. B. Robinson, R. C. Dynes, J. J. M. Valles and J. V. Waszczak, Scanning-tunnelingmicroscope obervation of the Abrikosov flux lattice and the density of states near and inside a fluxoid, Phys. Rev. Lett. 62, 214 (1989).
Maggio-Aprile, C. Renner, A. Erb, E. Walker and O. Fischer, Direct vortex lattice imaging and tunneling spectroscopy, Phys. Rev. Lett. 75: 2754–2757 (1995).
G.J. Germann, S.R. Cohen and G. Neubauer, Atomic scale friction of a diamon tip on diamond (100) and (111) surfaces,.L Appl. Phys. 73: 163–167 (1993).
M.D. Peny and I A. Ilarrison, lJniversal aspects of the atomic scale friction of diamond surfaces, J. Phys. Chem. 99: 960–65 (1995).
D. Sarid, `Scanning Force Microscopy“ Oxford University Press, New York (1991). 21 P. K. I Iansma, V. 13. Flings, O. Marti and C. E. Bracker, Scanning tunneling microscopy and atomic force microscopy: Application to biology and technology, Science 242: 209–216 (1988).
J. H. Hoh and P. K. Hansma, Atomic force microscopy for high resolution imaging in cell biology, Trends in Cell Biology 2: 208–213 (1992).
D. M. Eigler and E. K. Schweizer, Positioning single atoms with a scanning tunneling microscope, Nature 344: 524–526 (1990).
P. Avouris, ed., “Atomic and Nanometer-Seale Modification of Materials: Fundamentals and Applications” Kluwer Academic Publishers, Boston (1993).
P.H. Beton, A. Dunn and P. Moriarty, Manipulation of C50 molecules on a Si surface, Appl. l’hys. Lett. (in press).
M.F. Crommie, C. P. Lutz and D. M. Eigter, Confinement of electrons to quantum corrals on a metal surface, Science 262: 218–220 (1993).
E.J. Heller, M.I. Crommie, C.Y. Lutz and D.M. Eigler, Scattering and adsorption of surface electron P. Avouris waves in quantum corrals, Nature 369: 464–466 (1994).
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Crommie, M.F. (1997). Keynote Address. In: Cohen, S.H., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9325-3_1
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DOI: https://doi.org/10.1007/978-1-4757-9325-3_1
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