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Electron Dynamics in the Strong Field Limit of Photoionization

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Applications of High-Field and Short Wavelength Sources

Abstract

High precision photoelectron energy and angular distributions in helium and neon atoms for a broad intensity range reflect the change in the continuum dynamics that occurs as the ionization process evolves into the pure tunneling regime. Elastic rescattering of the laser-driven free electron from its parent ion core leaves a distinct signature on the spectra, providing a direct quantitative test of the various theories of strong field multiphoton ionization. We show that it takes a relatively complete semi-classical rescattering model to accurately reproduce the observed photoelectron distributions. However, the calculated inelastic rescattering rate fails to reproduce the measured nonsequential double ionization yields.

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Sheehy, B. et al. (1998). Electron Dynamics in the Strong Field Limit of Photoionization. In: DiMauro, L., Murnane, M., L’Huillier, A. (eds) Applications of High-Field and Short Wavelength Sources. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9241-6_36

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  • DOI: https://doi.org/10.1007/978-1-4757-9241-6_36

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-9243-0

  • Online ISBN: 978-1-4757-9241-6

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