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Fracture Toughness and Relaxation of Epoxy Resins at Cryogenic Temperatures

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Part of the book series: An International Cryogenic Materials Conference Publication ((ACRE,volume 40))

Abstract

The relationship between fracture toughness and several epoxy resins has been investigated at cryogenic temperatures. Resins for cryogenic use are thought to require high fracture toughness at cryogenic temperatures. The fracture toughness and mechanical and dielectric relaxation of resins were studied at low temperature. The amount of plasticizer and molecular weight between crosslinks was varied. It was found that the fracture toughness had a close relation to the relaxation behavior, and hence, the effect of plasticizer disappeared at liquid helium temperature. The resin with larger epoxide equivalent had a higher fracture toughness even at liquid helium temperature. This suggests a guideline for the molecular design for the resin with high fracture toughness at cryogenic temperature.

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References

  1. T. Yasuda, T. Hirokawa, Y. Iwasaki, S. Nishijima, and T. Okada, Compressive Strength under Shear Stress on 3D-FRP at Cryogenic Temperature, Adv. Cryog. Eng. 36B: 985 (1990)

    CAS  Google Scholar 

  2. S. Nishijima, T. Hukutsuka, K. Matsumoto, and T. Okada, Effect of Epoxy Cracking on Impregnated Windings, Adv. Cryog. Eng. 33: 125 (1988)

    Article  CAS  Google Scholar 

  3. S. Nishijima, S. Takahata, and T. Okada, Local Temperature Rise after Quench due to Epoxy Cracking in Impregnated Superconducting Windings, Adv. Cryog. Eng. 33: 135 (1988)

    Article  CAS  Google Scholar 

  4. T. Noguchi, S. Sato, K. Akagi, and M. Yoshida, J. Soc. Mater. Sci. Jpn. 40: 159 (1991)

    Article  Google Scholar 

  5. ASTM E399-a (1978)

    Google Scholar 

  6. I. Tanaka, G. Pezzotti, K. Matsushita, Y. Miyamoto, and T. Okamoto, Impurity-Enhanced Intergranular Cavity Formation in Silicon Nitride at High Temperatures, J. Am. Ceram. Soc. 74 [4]: 752 (1991)

    Article  CAS  Google Scholar 

  7. K. Matsushita, S. Osawa, and T. Okamoto, Internal Friction to Point Defects in Alumina Ceramics at Elevated Temperatures, J. Appl. Phys. Jpn. Lattice Defects in Ceramics: 125 (1989)

    Google Scholar 

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© 1994 Springer Science+Business Media New York

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Sawa, F., Nishijima, S., Ohtani, Y., Matsushita, K., Okada, T. (1994). Fracture Toughness and Relaxation of Epoxy Resins at Cryogenic Temperatures. In: Reed, R.P., Fickett, F.R., Summers, L.T., Stieg, M. (eds) Advances in Cryogenic Engineering Materials . An International Cryogenic Materials Conference Publication, vol 40. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9053-5_141

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  • DOI: https://doi.org/10.1007/978-1-4757-9053-5_141

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-9055-9

  • Online ISBN: 978-1-4757-9053-5

  • eBook Packages: Springer Book Archive

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